Paper Title:
Wettability Study of SiC in Correlation with XPS Analysis
  Abstract

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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
423-426
DOI
10.4028/www.scientific.net/MSF.457-460.423
Citation
V. Stambouli, D. Chaussende, M. Anikin, G. Berthomé, V. Thoreau, J.C. Joud, "Wettability Study of SiC in Correlation with XPS Analysis", Materials Science Forum, Vols. 457-460, pp. 423-426, 2004
Online since
June 2004
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