Paper Title:
Interface Electronic Structures of Transition Metal(Cr, Fe) on 6H(4H)-SiC(0001)Si Face by Soft X-Ray Fluorescence Spectroscopy
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
427-430
DOI
10.4028/www.scientific.net/MSF.457-460.427
Citation
M. Hirai, C. Kamezawa, S. Azatyan, Z. An, T. Shinagawa, T. Fujisawa, M. Kusaka, M. Iwami, "Interface Electronic Structures of Transition Metal(Cr, Fe) on 6H(4H)-SiC(0001)Si Face by Soft X-Ray Fluorescence Spectroscopy ", Materials Science Forum, Vols. 457-460, pp. 427-430, 2004
Online since
June 2004
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: A. Trinchi, W. Wlodarski, Sandro Santucci, D. Di Claudio, Maurizio Passacantando, C. Cantalini, B. Rout, S.J. Ippolito, K. Kalantar-Zadeh, G. Sberveglieri
Abstract:The microstructural characterization of r.f. magnetron sputtered ZnO thin films deposited on 6H-SiC is presented with a comprehensive...
123
Authors: Teresa L.Y. Cheung, Dickon H.L. Ng
Abstract:Biomorphic SiO2/C and SiC/C composites containing SiO2 nanorods and SiC nanowires, respectively, with natural wood structure maintained in...
291
Authors: Akimasa Kinoshita, Takashi Nishi, Takasumi Ohyanagi, Tsutomu Yatsuo, Kenji Fukuda, Hajime Okumura, Kazuo Arai
Abstract:The reaction and phase formation of the Ti/SiC Schottky contact as a function of the annealing temperature (400~700oC) were investigated....
643