Paper Title:
Optical and EPR Signatures of Intrinsic Defects in Ultra High Purity 4H-SiC
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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
461-464
DOI
10.4028/www.scientific.net/MSF.457-460.461
Citation
W.E. Carlos, E.R. Glaser, B.V. Shanabrook, "Optical and EPR Signatures of Intrinsic Defects in Ultra High Purity 4H-SiC", Materials Science Forum, Vols. 457-460, pp. 461-464, 2004
Online since
June 2004
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