Paper Title:
Photo-EPR and Hall Measurements on Undoped High Purity Semi-Insulating 4H-SiC Substrates
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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
501-504
DOI
10.4028/www.scientific.net/MSF.457-460.501
Citation
E. N. Kalabukhova, S.N. Lukin, D.V. Savchenko, W.C. Mitchel, W. D. Mitchell, "Photo-EPR and Hall Measurements on Undoped High Purity Semi-Insulating 4H-SiC Substrates ", Materials Science Forum, Vols. 457-460, pp. 501-504, 2004
Online since
June 2004
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