Paper Title:
Residual Stresses and Stacking Faults in n-Type 4H-SiC Epilayers
  Abstract

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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
529-532
DOI
10.4028/www.scientific.net/MSF.457-460.529
Citation
R. S. Okojie, M. Zhang, P. Pirouz, "Residual Stresses and Stacking Faults in n-Type 4H-SiC Epilayers ", Materials Science Forum, Vols. 457-460, pp. 529-532, 2004
Online since
June 2004
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