Paper Title:
Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes
  Abstract

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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
533-536
DOI
10.4028/www.scientific.net/MSF.457-460.533
Citation
R. E. Stahlbush, M. E. Twigg, K. G. Irvine, J. J. Sumakeris, T. P. Chow, P. A. Losee, L. Zhu, Y. Tang, W. Wang, "Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes", Materials Science Forum, Vols. 457-460, pp. 533-536, 2004
Online since
June 2004
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