Paper Title:
Raman Imaging Characterization of Structural and Electrical Properties in 4H SiC
  Abstract

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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
609-612
DOI
10.4028/www.scientific.net/MSF.457-460.609
Citation
M. Mermoux, A. Crisci, F. Baillet, "Raman Imaging Characterization of Structural and Electrical Properties in 4H SiC", Materials Science Forum, Vols. 457-460, pp. 609-612, 2004
Online since
June 2004
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