Paper Title:
As-Grown and Process-Related Defects in Schottky Barrier Diodes Fabricated on Bulk Off-Axis n-Type 6H-SiC
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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
697-700
DOI
10.4028/www.scientific.net/MSF.457-460.697
Citation
E. van Wyk, A.W.R. Leitch, "As-Grown and Process-Related Defects in Schottky Barrier Diodes Fabricated on Bulk Off-Axis n-Type 6H-SiC", Materials Science Forum, Vols. 457-460, pp. 697-700, 2004
Online since
June 2004
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