Paper Title:
Extraction of the Schottky Barrier Height for Ti/Al Contacts on 4H-SiC from I-V and C-V Measurements
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
993-996
DOI
10.4028/www.scientific.net/MSF.457-460.993
Citation
F. Moscatelli, A. Scorzoni, A. Poggi, G.C. Cardinali, R. Nipoti, "Extraction of the Schottky Barrier Height for Ti/Al Contacts on 4H-SiC from I-V and C-V Measurements", Materials Science Forum, Vols. 457-460, pp. 993-996, 2004
Online since
June 2004
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.