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Study of Local Microstructure and Texture Heterogeneities in Hot Rolled CGO Fe-3%Si Sheets

Journal Materials Science Forum (Volumes 467 - 470)
Volume Recrystallization and Grain Growth
Edited by B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot
Pages 123-128
DOI 10.4028/www.scientific.net/MSF.467-470.123
Citation Francisco Cruz-Gandarilla et al., 2004, Materials Science Forum, 467-470, 123
Online since October, 2004
Authors Francisco Cruz-Gandarilla, Thierry Baudin, Richard Penelle, Hector Mendoza León
Keywords Electron Backscatter Diffraction (EBSD), Fe-Si, Goss Texture, Hot Rolling, Orientation Image Microscopy (OIM), Texture
Abstract

After secondary recrystallization, the Fe-3%Si alloys, grade Conventional Grain Oriented (C.G.O.), exhibit a Goss texture that is sought for minimizing watt losses in transformer cores. The mechanisms of Goss grain formation and their evolution during the processing route from hot rolling to decarburizing such as the early first steps of abnormal growth are not still well cleared up. This work deals with the influence of local microstructure and texture heterogeneities observed by X-ray diffraction (XRD) and Electron Back Scattered Diffraction (EBSD) at the hot rolling step. The present results complete those previously obtained by neutron diffraction [1]. Presence of Goss grain colonies at about the quarter of the hot rolled sheet is probably, as it has already been suggested, at the origin of the Goss grain presence at the primary recrystallized state.

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