Paper Title:
Investigation of the Primary Recrystallisation Microstructure of Cold Rolled and Annealed Fe 3% Si Single Crystals with Goss Orientation
  Abstract

A silicon steel single crystal with {110}<001> Goss orientation was cold rolled up to 89 % thickness reduction and subsequently annealed. The evolution of the macroscopic cold rolling texture was investigated by x-ray diffraction. Local orientation relationships and the microstructure around and within Goss grains of deformed and annealed samples were analysed using the electron backscatter diffraction (EBSD) technique. During cold rolling a texture consisting of two strong {111}<112> components and a minor {110}<001> Goss component develops. After primary recrystallisation the texture is characterized by a strong Goss component. Goss-oriented grains that remain after high deformation are considered to be the origin for the primary recrystallisation texture.

  Info
Periodical
Materials Science Forum (Volumes 467-470)
Edited by
B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot
Pages
129-134
DOI
10.4028/www.scientific.net/MSF.467-470.129
Citation
D. Dorner, L. Lahn, S. Zaefferer, "Investigation of the Primary Recrystallisation Microstructure of Cold Rolled and Annealed Fe 3% Si Single Crystals with Goss Orientation", Materials Science Forum, Vols. 467-470, pp. 129-134, 2004
Online since
October 2004
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$32.00
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