Paper Title:
Thermal Stability of Electrodeposited Ni and Ni-Co Layers; an EBSD-Study
  Abstract

The influence of heat treatment on the microstructure and the microtexture of electrodeposited Ni and Ni-Co layers was investigated with Electron Backscatter Diffraction (EBSD) with high resolution. Samples were annealed for 1 hour at 523 K and 673 K, the temperature region wherein recrystallisation occurs. The results are discussed in relation to the resolution of EBSD for the very fine grained electrodeposits and previous X-ray diffraction investigations.

  Info
Periodical
Materials Science Forum (Volumes 467-470)
Edited by
B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot
Pages
1345-1352
DOI
10.4028/www.scientific.net/MSF.467-470.1345
Citation
A.A. Rasmussen, A. Gholinia, P. W. Trimby, M. A.J. Somers, "Thermal Stability of Electrodeposited Ni and Ni-Co Layers; an EBSD-Study", Materials Science Forum, Vols. 467-470, pp. 1345-1352, 2004
Online since
October 2004
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Price
$32.00
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