Paper Title:
Recrystallization Texture and Microstructure in Ni and AlMg1Mn1 Determined with High-Energy Synchrotron Radiation
  Abstract

The newly developed “sweeping detector” technique with high energy synchrotron radiation allows to measure textures and microstructures of materials with high location and orientation resolution. This method was applied to hot rolled aluminium manganese alloys and to rolled nickel samples in different recrystallization stages. The grain-resolved measurements show, impressively, many details of the recrystallization process which can otherwise not be seen. That can be the base for comprehensive recrystallization theories.

  Info
Periodical
Materials Science Forum (Volumes 467-470)
Edited by
B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot
Pages
1379-1384
DOI
10.4028/www.scientific.net/MSF.467-470.1379
Citation
H. Klein, A. Preusser, H. J. Bunge, L. Raue, "Recrystallization Texture and Microstructure in Ni and AlMg1Mn1 Determined with High-Energy Synchrotron Radiation", Materials Science Forum, Vols. 467-470, pp. 1379-1384, 2004
Online since
October 2004
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$32.00
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