Paper Title:
A Technique for Real-Time, In-Situ SEM Observation of Grain Growth at Elevated Temperatures
  Abstract

We present a novel electron detector and technique permitting orientation contrast images to be generated using back-scattered electron signals. The detector is a modification of the converter plate. It is unaffected by Infra-Red and light photons and invulnerable to the effects of heat. Consequently, the detector is removed as the temperature limiting factor in elevated temperature SEM grain observations. The detector has been successfully applied to an environmental SEM (ESEM) operating in high vacuum mode and has produced good quality video image sequences of hot metal specimens with frame rates between 1 per second and 1 per 30 seconds (largely material dependent). Temperatures attained were up to 850°C, limited by the capability of the hot stage. Although developed for the ESEM the technique is applicable to any SEM provided that adequate measures are taken to manage contamination and heat effects on other microscope components. We have produced images and short, accelerated video sequences of recrystallisation and grain growth phenomena in steel, aluminium, copper and gold by the new technique. The technique has also successfully imaged phase transformations and high temperature behaviour of microelectronic materials.

  Info
Periodical
Materials Science Forum (Volumes 467-470)
Edited by
B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot
Pages
1385-1388
DOI
10.4028/www.scientific.net/MSF.467-470.1385
Citation
I.M. Fielden, J.M. Rodenburg, "A Technique for Real-Time, In-Situ SEM Observation of Grain Growth at Elevated Temperatures", Materials Science Forum, Vols 467-470, pp. 1385-1388, Oct. 2004
Online since
October 2004
Price
US$ 28,-
Share
Authors: Petr Wandrol, Jiřina Matějková, Antonín Rek
Abstract:This paper deals with imaging by means of backscattered electrons in the high resolution scanning electron microscopy. Possible...
313
Authors: Peng Li, Sheng Xiang Bao, De Zheng Zhang, Li Bo Zhuang, Li Li Ma
Abstract:The study of the secondary electron composition contrast imaging method have been developed with a conventional scanning electron microscope...
255
Authors: Hideki Matsushima, Toshiaki Suzuki, Takeshi Nokuo
Chapter 1: Techniques
Abstract:Functions of an observation and an analysis in electron microscope, such as scanning electron microscope (SEM) or transmission electron...
3