In Situ Investigation of Bulk Nucleation by X-Ray Diffraction |
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| Journal | Materials Science Forum (Volumes 467 - 470) |
|---|---|
| Volume | Recrystallization and Grain Growth |
| Edited by | B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot |
| Pages | 81-86 |
| DOI | 10.4028/www.scientific.net/MSF.467-470.81 |
| Citation | A.W. Larsen et al., 2004, Materials Science Forum, 467-470, 81 |
| Online since | October, 2004 |
| Authors | A.W. Larsen, C. Gundlach, Henning Friis Poulsen, L. Margulies, Q. Xing, Dorte Juul Jensen |
| Keywords | 3DXRD, Nucleation, Orientation Measurements, Triple Junctions, X-Ray Diffraction (XRD) |
| Abstract | A new method for in-situ studies of nucleation in bulk metals based on high energy synchrotron radiation is presented. Copper samples cold rolled 20% are investigated. The crystallographic orientations near triple junctions are characterized using non-destructive 3DXRD microscopy before, during, and after annealing for 1 hour at 290°C. This method allows in-situ identification of new nuclei and the deformed material, which spawns the nuclei. Also, since data is acquired during annealing nucleation kinetics can be studied. |
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