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Atomic Structure of Interfaces in Silicon Nitride

Journal Materials Science Forum (Volume 47)
Volume Preparation and Properties of Silicon Nitride Based Materials
Edited by D.A. Bonnel and T. Y. Tien
Pages 143-161
DOI 10.4028/www.scientific.net/MSF.47.143
Citation J.Y. Laval et al., 1991, Materials Science Forum, 47, 143
Authors J.Y. Laval, A. Thorel
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