Paper Title:
Structural Properties of Sputter-Deposited ZnO Thin Films Depending on the Substrate Materials
  Abstract

We have demonstrated the growth of ZnO thin films with c-axis orientation at room temperature on various substrates such as Si(100), SiO2, and sapphire by the r.f. magnetron sputtering method. X-ray diffraction (XRD) and scanning electron microscopy altogether indicated that the larger grain size and the higher crystallinity were attained when the ZnO films were deposited on sapphire substrates, compared to the films on Si or SiO2 substrates. The c-axis lattice constant decreased by thermal annealing for the ZnO films deposited on Si or SiO2 substrates, while increased by the thermal annealing for the ZnO films grown on sapphire substrates.

  Info
Periodical
Materials Science Forum (Volumes 475-479)
Main Theme
Edited by
Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie
Pages
1825-1828
DOI
10.4028/www.scientific.net/MSF.475-479.1825
Citation
J. H. Myung, N. H. Kim, H. W. Kim, "Structural Properties of Sputter-Deposited ZnO Thin Films Depending on the Substrate Materials", Materials Science Forum, Vols. 475-479, pp. 1825-1828, 2005
Online since
January 2005
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$32.00
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