Paper Title:
Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source
  Abstract

In-situ measurement of local orientation and strain Has Been carried out for a copperpolycrystals under a uniaxial loading using a synchrotron x-ray microdiffraction method at the Advanced Light Source. The heterogeneities of deformation-induced microstructure within single grains were observed. There were differences in the selection of simultaneously acting slip systems among neighboring volume elements within a grain.

  Info
Periodical
Materials Science Forum (Volumes 475-479)
Main Theme
Edited by
Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie
Pages
4149-4152
DOI
10.4028/www.scientific.net/MSF.475-479.4149
Citation
H.D. Joo, J.S. Kim, C.W. Bark, J.Y. Kim, Y. M. Koo, N. Tamura, "Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source", Materials Science Forum, Vols. 475-479, pp. 4149-4152, 2005
Online since
January 2005
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