Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization |
| Journal |
Materials Science Forum (Volumes 475 - 479) |
| Volume |
PRICM-5 |
| Edited by |
Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie |
| Pages |
9-20 |
| DOI |
10.4028/www.scientific.net/MSF.475-479.9 |
| Citation |
Hiroyasu Saka, 2005, Materials Science Forum, 475-479, 9 |
| Online since |
January, 2005 |
| Authors |
Hiroyasu Saka |
| Keywords |
Crack, Electron Holography, Failure Analysis, Focused Ion Beam (FIB), Fracture, GA Steel, Microstructure Characterization, Solder Joint, TEM |
| Full Paper |
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