Paper Title:
Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization
  Abstract

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Periodical
Materials Science Forum (Volumes 475-479)
Main Theme
Edited by
Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie
Pages
9-20
DOI
10.4028/www.scientific.net/MSF.475-479.9
Citation
H. Saka, "Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization", Materials Science Forum, Vols. 475-479, pp. 9-20, 2005
Online since
January 2005
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Price
$32.00
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