Paper Title:

Suppression of the Twin Formation in CVD Growth of (111) 3C-SiC on (110) Si Substrate

Periodical Materials Science Forum (Volumes 483 - 485)
Main Theme Silicon Carbide and Related Materials 2004
Edited by Roberta Nipoti, Antonella Poggi and Andrea Scorzoni
Pages 193-196
DOI 10.4028/www.scientific.net/MSF.483-485.193
Citation Taro Nishiguchi et al., 2005, Materials Science Forum, 483-485, 193
Online since May, 2005
Authors Taro Nishiguchi, Mitsutaka Nakamura, Koji Nishio, Toshiyuki Isshiki, Satoru Ohshima, Shigehiro Nishino
Keywords (110), 3C-SiC, Chemical Vapor Deposition (CVD), Hetero-Epitaxy, Off-Axis, Twin
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Abstract

Chemical vapor deposition of (111) 3C-SiC on (110) Si substrate was carried out, and the effect of the substrate off-axis introduced on (110) Si substrate for suppressing the twin formation in 3C-SiC hetero-epitaxial layers was investigated. From the growth on hemispherically polished (110) Si substrate, it was found that the off-axis toward the [001] Si axis had a noble effect for suppressing the twin formation, while the off-axis toward the [110] Si axis was ineffective. The growth of single 3C-SiC crystal containing few double positioning boundaries, which are related with the twin formation, was demonstrated on the (110) Si substrate 3° off-axis toward the [001] Si axis. Transmission electron microscopic observation revealed that double positioning boundaries on the (110) Si substrate off-axis toward the [001] Si axis were nearly eliminated within the initial a few hundreds nano meter in thickness.