Suppression of the Twin Formation in CVD Growth of (111) 3C-SiC on (110) Si Substrate
| Periodical | Materials Science Forum (Volumes 483 - 485) |
|---|---|
| Main Theme | Silicon Carbide and Related Materials 2004 |
| Edited by | Roberta Nipoti, Antonella Poggi and Andrea Scorzoni |
| Pages | 193-196 |
| DOI | 10.4028/www.scientific.net/MSF.483-485.193 |
| Citation | Taro Nishiguchi et al., 2005, Materials Science Forum, 483-485, 193 |
| Online since | May, 2005 |
| Authors | Taro Nishiguchi, Mitsutaka Nakamura, Koji Nishio, Toshiyuki Isshiki, Satoru Ohshima, Shigehiro Nishino |
| Keywords | (110), 3C-SiC, Chemical Vapor Deposition (CVD), Hetero-Epitaxy, Off-Axis, Twin |
| Price | US$ 28,- |
Chemical vapor deposition of (111) 3C-SiC on (110) Si substrate was carried out, and the effect of the substrate off-axis introduced on (110) Si substrate for suppressing the twin formation in 3C-SiC hetero-epitaxial layers was investigated. From the growth on hemispherically polished (110) Si substrate, it was found that the off-axis toward the [001] Si axis had a noble effect for suppressing the twin formation, while the off-axis toward the [110] Si axis was ineffective. The growth of single 3C-SiC crystal containing few double positioning boundaries, which are related with the twin formation, was demonstrated on the (110) Si substrate 3° off-axis toward the [001] Si axis. Transmission electron microscopic observation revealed that double positioning boundaries on the (110) Si substrate off-axis toward the [001] Si axis were nearly eliminated within the initial a few hundreds nano meter in thickness.