Paper Title
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Authors: Samir Zelmat, Marie Laure Locatelli, Thierry Lebey
Abstract:Silicon carbide (SiC) is a wide bandgap semiconductor suitable for high-voltage, highpower and high-temperature applications [1]. However,...
717
Authors: Tomonori Nakamura, Toshiyuki Miyanagi, Hidekazu Tsuchida, Isaho Kamata, Tamotsu Jikimoto, Kunikaza Izumi
Abstract:We investigated the effect of high temperature annealing on the Schottky barrier height (Fb) and the ideality factor (n-factor) of a Mo...
721
Authors: Oleg A. Agueev, Sergey P. Avdeev, Alexander M. Svetlichnyi, Raisa V. Konakova, Victor V. Milenin, Petr M. Lytvyn, Oksana S. Lytvyn, Olga B. Okhrimenko, Stanislav I. Soloviev, Tangali S. Sudarshan
Abstract:An effect of electron beam annealing (EBA) on both surface morphology and characteristics of test Ti/n-6H-SiC contacts was investigated. It...
725
Authors: Fabrizio Roccaforte, Filippo Giannazzo, Corrado Bongiorno, Sebania Libertino, Francesco La Via, Vito Raineri
Abstract:The effects of ion irradiation on the Ti/4H-SiC Schottky barrier are discussed. The Ti/SiC interfacial region of test Schottky diodes was...
729
Authors: Sergio Ferrero, A. Albonico, Umberto M. Meotto, G. Rambolà, Samuele Porro, Fabrizio Giorgis, Denis Perrone, Luciano Scaltrito, E. Bontempi, L.E. Depero, G. Richieri, Luigi Merlin
Abstract:In this work we report an analysis on Ni/4H-SiC interfaces aimed at optimizing the ohmic contacts. Several thermal cycles have been performed...
733
Authors: Francesco Moscatelli, Andrea Scorzoni, Antonella Poggi, Mariaconcetta Canino, Roberta Nipoti
Abstract:Recently Ni/SiC contacts have been studied in order to achieve very low contact resistivity (rc) values on n-type SiC. In this work contact...
737
Authors: S. Soubatch, Ulrich Starke
Abstract:Low-energy electron diffraction (LEED), scanning tunneling microscopy (STM) and spectroscopy (STS), and Auger electron spectroscopy (AES)...
741
Authors: Antonio Castaldini, Anna Cavallini, Marco Rossi, M. Cocuzza, C. Ricciardi
Abstract:We report on the investigation of electrical properties of polycrystalline 3C-SiC thin films deposited on oxidized Si by low pressure...
745
Authors: Lilyana Kolaklieva, Roumen Kakanakov, Ts. Marinova, G. Lepoeva
Abstract:X-ray photoelectron spectroscopy is used to study the effect of the metal composition on the electrical and thermal properties of Au/Pd/Ti/Pd...
749
Authors: J. Anthony Powell, Philip G. Neudeck, Andrew J. Trunek, Phillip B. Abel
Abstract:This paper presents new observations resulting from in-situ high temperature hydrogen etching of 4H-SiC mesas that were step-free prior to...
753
Showing 171 to 180 of 255 Paper Titles