Paper Title:
X-Ray Stress Measurement Using Whole Back Diffraction Ring
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 490-491)
Edited by
Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu
Pages
137-142
DOI
10.4028/www.scientific.net/MSF.490-491.137
Citation
S. I. Ohya, K. Akita, Y. Shitaba, M. Yoshikawa, "X-Ray Stress Measurement Using Whole Back Diffraction Ring", Materials Science Forum, Vols. 490-491, pp. 137-142, 2005
Online since
July 2005
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