Paper Title:
A New Method for Measuring Residual Stress Relaxation during Nanoindentation
  Abstract

The work of nanoindentation approach is developed and applied for measure of residual stress relaxation during indenter penetrates in thin films. The residual stress at given penetration depth is measured from the different integral area which under load-depth curve of different stress state. This method can measure residual stress relaxation without the need for estimating yield strength, strain hardening index and hardness.

  Info
Periodical
Materials Science Forum (Volumes 490-491)
Edited by
Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu
Pages
213-217
DOI
10.4028/www.scientific.net/MSF.490-491.213
Citation
F. Wang, K. W. Xu, "A New Method for Measuring Residual Stress Relaxation during Nanoindentation", Materials Science Forum, Vols. 490-491, pp. 213-217, 2005
Online since
July 2005
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$32.00
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