Paper Title:
In Situ Synchrotron Measurements of Oxide Growth Strains
  Abstract

Synchrotron x-rays are used for in situ determination of oxide strain, during oxide formation on a Kanthal A1 FeCrAlZr substrate at 1160°C. The measurements rely on use of high-energy (~80keV) x-rays and transmission geometry, and the methodology of the strain measurements is presented. Oxide growth strains at elevated temperature, relative to pure alumina, were seen to be small, while temperature excursions induced significant strains. Furthermore, significant strain relaxation was observed during isothermal holds, suggesting oxide creep as a major relaxation mechanism. Upon cooling to room temperature, significant residual strains developed, with a corresponding in-plane residual stress of -3.7 GPa.

  Info
Periodical
Materials Science Forum (Volumes 490-491)
Edited by
Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu
Pages
287-293
DOI
10.4028/www.scientific.net/MSF.490-491.287
Citation
J. Almer, G. A. Swift, J. A. Nychka, E. Üstündag, D. R. Clarke, "In Situ Synchrotron Measurements of Oxide Growth Strains", Materials Science Forum, Vols. 490-491, pp. 287-293, 2005
Online since
July 2005
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Price
$32.00
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