Paper Title:
XRD Stress Analysis in a TiAl Based Intermetallic Multicrystal
  Abstract

Under specific manufacturing processes and heat treatments, the gamma titanium Aluminide Ti- 47Al-2Cr-2Nb presents a nearly lamellar microstructure with coarse lamellar grains (with alternating g and a2 lamellae) and dispersed small g grains. The obtained microstructure gives a relatively coarse grain size (approximately 0.4 mm x 3 mm). Residual stresses can then be generated between g and a2 lamellae inside the lamellar grain and also between different grains because of the lattice mismatch between tetragonal structure of g phase and hexagonal structure of a2 phase. A specific single crystalline XRD method is applied on these two non-cubic phases to determine the local residual stresses in two grains on each side of a grain boundary.

  Info
Periodical
Materials Science Forum (Volumes 490-491)
Edited by
Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu
Pages
684-689
DOI
10.4028/www.scientific.net/MSF.490-491.684
Citation
W. Seiler, G. Hoël, M. Thomas, V. Ji, "XRD Stress Analysis in a TiAl Based Intermetallic Multicrystal", Materials Science Forum, Vols. 490-491, pp. 684-689, 2005
Online since
July 2005
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$32.00
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