Paper Title:
Application of In Situ HREM to Study Crystallization in Materials
  Abstract

A review is given of the application of in situ transmission electron microscopy to study various processes associated with the crystallization of amorphous thin films. Solid phase epitaxial regrowth of ion-implanted silicon is compared with nucleation and growth in deposited thin films. The mechanism of metal-mediated crystallization is deduced directly from high resolution recordings, and the kinetics of tantalum oxide devitrefication are obtained. The advantages of direct in situ observation are described

  Info
Periodical
Edited by
Dragan P. Uskokovic, Slobodan K. Milonjic, Djan I. Rakovic
Pages
7-12
DOI
10.4028/www.scientific.net/MSF.494.7
Citation
R. Sinclair, K. H. Min, U. Kwon, "Application of In Situ HREM to Study Crystallization in Materials", Materials Science Forum, Vol. 494, pp. 7-12, 2005
Online since
September 2005
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: K. Konopka, M. Trzaska, Dariusz Oleszak, W. Zieliński, Krzysztof J. Kurzydłowski
249
Authors: Sadahiro Tsurekawa, H. Fujii, V.A. Yardley, T. Matsuzaki, T. Watanabe
Abstract:Crystallization kinetics and texture evolution in iron-based amorphous alloys (Fe78Si9B13, Fe73.5Si13.5B9Nb3Cu1) under a magnetic field have...
1371
Authors: Jing Lu, Yan Hui Wang
Abstract:Quasi atomic layer deposition method has been successfully used to coat detonation nanodiamonds with ultrathin silicon film from...
226
Authors: Ryusuke Nakamura, Takehiro Shudo, Akihiko Hirata, Manabu Ishimaru, Hideo Nakajima
Abstract:Formation behavior of nanovoids during the annealing of amorphous Al2O3 and WO3 was studied by transmission...
541
Authors: S. Ahmadi, H.R. Shahverdi, S.S. Saremi
Chapter 14: Nanomaterials and Nanomanufacturing
Abstract:Nano- crystallization of Fe55Cr18Mo7B16C4 bulk amorphous alloy has been analyzed by X-...
3858