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Textures of Materials - ICOTOM 14

Materials Science Forum Volumes 495 - 497

• Papers
• Abstracts

• p3 Application of Orientation Microscopy in SEM and TEM for the Study of Texture Formation during Recrystallisation Processes   [ 1 M ]
  Authors: Stefan Zaefferer
• p13 Texture and Symmetry Relationships in Piezoelectric Materials   [ 3 M ]
  Authors: Thomas S. Key, Jacob L. Jones, William F. Shelley, Ben J. Iverson, Hsin Yu Li, Elliott B. Slamovich, Alexander H. King, Keith J. Bowman
• p23 Microstructure Sensitive Design with First Order Homogenization Theories and Finite Element Codes   [ 795 K ]
  Authors: Surya R. Kalidindi, J. Houskamp, G. Proust, H. Duvvuru
• p31 The Application of Multiscale Modelling for the Prediction of Plastic Anisotropy and Deformation Textures   [ 159 K ]
  Authors: Paul Van Houtte, Albert Van Bael, Marc Seefeldt, Laurent Delannay
• p45 Complexity of the Anisotropy of Magnetic Susceptibility in Single-Phase Deformed, Low-Grade, Cleaved Mudstone   [ 1 M ]
  Authors: Timothy N. Debacker, Manuel Sintubin, Philippe Robion
• p57 Crystallographic Control on the Development of Texture in Precipitated Quartz Grains   [ 1 M ]
  Authors: Leonardo Lagoeiro, Paola Ferreira, Cristiane Castro
• p63 Textures in Experimentally Deformed Olivine Aggregates: The Effects of Added Water and Melt   [ 409 K ]
  Authors: F. Heidelbach, B. Holtzman, S. Hier-Majumder, D. Kohlstedt
• p69 Joint Inclination Effect on Strength, Stress-Strain Curve and Strain Localization of Rock in Plane Strain Compression   [ 573 K ]
  Authors: X.B. Wang
• p77 Development of Nonuniform Substructure and Microstrain Distribution by Texture Formation in Metal Materials   [ 868 K ]
  Authors: Yuriy Perlovich, Margarita Isaenkova, V. Fesenko, Hans Joachim Bunge
• p87 Exploration of the Six-Dimensional Orientation-Location Space with Hard X-Rays   [ 45 M ]
  Authors: Hans Joachim Bunge
• p99 Accounting for Secondary Extinction in Thickness Measurement of Thin Films by X-Ray Absorption   [ 85 K ]
  Authors: I. Tomov
• p105 A PF Measurement Attachment of the Work-Piece for ODF Analysis   [ 99 K ]
  Authors: Qiu Lin Wu, Xiaojun Hu, Kemao Lv, Shu Bo Liu, Zuming Fu, Xiaomin Sun, Jian Min Wang, Limin Li
• p107 Quantitative Texture Measurements Using Neutron Time-Of-Flight Diffraction   [ 24 M ]
  Authors: Sven C. Vogel, Ch. Hartig, R.B. Von Dreele, H.R. Wenk, D.J. Williams
• p113 Quantitative Texture Analysis with the HIPPO TOF Diffractometer   [ 939 K ]
  Authors: J. Pehl, Siegfried Matthies, H.R. Wenk, Luca Lutterotti, Sven C. Vogel
• p119 Effect of Strong Neutron Absorption on Texture and Diffraction Data Analysis   [ 146 K ]
  Authors: H.M. Volz, Sven C. Vogel, J.A. Roberts, A.C. Lawson, D.J. Williams, L.L. Daemen