Paper Title:
Texture Determination of Thin Cu-Wires by Synchrotron Radiation
  Abstract

A new method to investigate thin wires has been tested, which is based on a special sample holder and on a high energy X-rays. Due to the high penetration power of high energy Xrays quantitative texture data will be obtained without any additional corrections such as constant volume correction and absorption correction. The measurements have been carried out at the high energy beam line BW5 at HASYLAB – DESY (Hamburg). In order to overcome grain statistics problems on the investigated Cu-wire of 122µm thickness a special scanning routine together with the sample preparation allows to average over a wire length between 1mm and up to 240 mm.

  Info
Periodical
Materials Science Forum (Volumes 495-497)
Edited by
Paul Van Houtte and Leo Kestens
Pages
131-136
DOI
10.4028/www.scientific.net/MSF.495-497.131
Citation
H. G. Brokmeier, B. Weiss, S. B. Yi, W. Y. Yi, K. D. Liss, T. Lippmann, "Texture Determination of Thin Cu-Wires by Synchrotron Radiation", Materials Science Forum, Vols. 495-497, pp. 131-136, 2005
Online since
September 2005
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