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Nanometrology – Nanopositioning- and Nanomeasuring Machine with Integrated Nanopobes

Journal Materials Science Forum (Volumes 505 - 507)
Volume Progress on Advanced Manufacture for Micro/Nano Technology 2005
Edited by Wunyuh Jywe, Chieh-Li Chen, Kuang-Chao Fan, R.F. Fung, S.G. Hanson,Wen-Hsiang Hsieh, Chaug-Liang Hsu, You-Min Huang, Yunn-Lin Hwang, Gerd Jäger, Y.R. Jeng, Wenlung Li, Yunn-Shiuan Liao, Chien-Chang Lin, Zong-Ching Lin, Cheng-Kuo Sung and Ching-Huan Tzeng
Pages 7-12
DOI 10.4028/www.scientific.net/MSF.505-507.7
Citation Gerd Jäger et al., 2006, Materials Science Forum, 505-507, 7
Online since January, 2006
Authors Gerd Jäger, T. Hausotte, Eberhard Manske, H.-J. Büchner, R. Mastylo, N. Dorozhovets, R. Füßl, R. Grünwald
Keywords Interferometer, Nano Metrology, Nanopositioning, Nanoprobe
Abstract

The paper describes the operation of a high-precision wide scale three-dimensional nanopositioning and nanomeasuring machine (NPM-Machine) having a resolution of 0,1 nm over the positioning and measuring range of 25 mm x 25 mm x 5 mm. The NPM-Machine has been developed by the Technische Universität Ilmenau and manufactured by the SIOS Meßtechnik GmbH Ilmenau. The machines are operating successfully in several German and foreign research institutes including the Physikalisch-Technische Bundesanstalt (PTB). The integration of several, optical and tactile probe systems and scanning force microscopes makes the NPM-Machine suitable for various tasks, such as large-area scanning probe microscopy, mask and water inspection, circuit testing as well as measuring optical and mechanical precision work pieces such as micro lens arrays, concave lenses, mm-step height standards.

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