Paper Title:
EDS Assisted Phase Differentiation in Orientation Imaging Microscopy
  Abstract

Automated Electron Backscatter Diffraction (EBSD) or Orientation Imaging Microscopy (OIM) has proven to be a viable technique for investigating microtexture in polycrystalline materials. It is particularly useful for investigating orientation relationships between phases in multiphase materials. However, when phases do not significantly vary in crystallographic structure, OIM is limited in its capability to reliably differentiate between phases. Through simultaneous collection of EBSD data and chemical data via X-Ray Energy Dispersive Spectroscopy (EDS) it is possible to dramatically improve upon the phase differentiation capabilities of either technique individually. This presentation will introduce a methodology for combining the two techniques as well as show a few example applications.

  Info
Periodical
Edited by
H. Balmori-Ramírez, M. Brito, J.G. Cabañas-Moreno, H.A. Calderón-Benavides, K. Ishizaki and A. Salinas-Rodríguez
Pages
11-16
DOI
10.4028/www.scientific.net/MSF.509.11
Citation
S. I. Wright, M. M. Nowell, "EDS Assisted Phase Differentiation in Orientation Imaging Microscopy", Materials Science Forum, Vol. 509, pp. 11-16, 2006
Online since
March 2006
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Price
$32.00
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