Insights on Amorphous Silicon Nip and MIS 3D Position Sensitive Detectors |
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| Journal | Materials Science Forum (Volumes 514 - 516) |
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| Volume | Advanced Materials Forum III |
| Edited by | Paula Maria Vilarinho |
| Pages | 13-17 |
| DOI | 10.4028/www.scientific.net/MSF.514-516.13 |
| Citation | Rodrigo Martins et al., 2006, Materials Science Forum, 514-516, 13 |
| Online since | May, 2006 |
| Authors | Rodrigo Martins, Daniel Costa, Hugo Águas, Fernanda Soares, António Marques, Isabel Ferreira, P.M.R. Borges, Sergio Pereira, Leandro Raniero, Elvira Fortunato |
| Keywords | Amorphous Silicon, Electronic Devices, Optical Sensors, Position Sensitive Detector (PSD) |
| Abstract | This work aims to report results of the spatial and frequency optical detection limits of integrated arrays of 32 one-dimensional amorphous silicon thin film position sensitive detectors with nip or MIS structure, under continuous and pulsed laser operation conditions. The arrays occupy a total active area of 45 mm2 and have a plane image resolution better than 15 m with a cut-off frequency of about 6.8 kHz. The non-linearity of the array components varies with the frequency, being about 1.6% for 200 Hz and about 4% for the cut-off frequency (6.8 kHz). |
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