Paper Title:
Insights on Amorphous Silicon Nip and MIS 3D Position Sensitive Detectors
  Abstract

This work aims to report results of the spatial and frequency optical detection limits of integrated arrays of 32 one-dimensional amorphous silicon thin film position sensitive detectors with nip or MIS structure, under continuous and pulsed laser operation conditions. The arrays occupy a total active area of 45 mm2 and have a plane image resolution better than 15 m with a cut-off frequency of about 6.8 kHz. The non-linearity of the array components varies with the frequency, being about 1.6% for 200 Hz and about 4% for the cut-off frequency (6.8 kHz).

  Info
Periodical
Materials Science Forum (Volumes 514-516)
Edited by
Paula Maria Vilarinho
Pages
13-17
DOI
10.4028/www.scientific.net/MSF.514-516.13
Citation
R. Martins, D. Costa, H. Águas, F. Soares, A. Marques, I. Ferreira, P.M.R. Borges, S. Pereira, L. Raniero, E. Fortunato, "Insights on Amorphous Silicon Nip and MIS 3D Position Sensitive Detectors", Materials Science Forum, Vols. 514-516, pp. 13-17, 2006
Online since
May 2006
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$32.00
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