Paper Title:
Sub-Surface Defects Induced by Low Energy Ar+ Sputtering of Silver
  Abstract

Induced defects in silver polycrystalline samples irradiated with 4 keV Ar+ were characterised with slow positron implantation spectroscopy. The implanted gas was found to interact with ion irradiation defects. The evolution of the defects and gas-defect interactions were followed through a multi-step isochronal annealing treatment. Two different defected regions were detected. A region near to the surface, due to a distribution of vacancy-like defects produced by irradiation, and a deeper one due to coalescence of Ar. The deeper defects evolve with thermal treatments and probably produce cavities which are not easily recovered.

  Info
Periodical
Materials Science Forum (Volumes 514-516)
Edited by
Paula Maria Vilarinho
Pages
1608-1612
DOI
10.4028/www.scientific.net/MSF.514-516.1608
Citation
M. Duarte Naia, P. M. Gordo, O. M.N.D. Teodoro, A. P. de Lima, A. M.C. Moutinho, R. S. Brusa, "Sub-Surface Defects Induced by Low Energy Ar+ Sputtering of Silver", Materials Science Forum, Vols. 514-516, pp. 1608-1612, 2006
Online since
May 2006
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Price
$32.00
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