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Relaxor-Like Behavior of Self-Polarized Pb(Zr,Ti)O3 Thin Films

Journal Materials Science Forum (Volumes 514 - 516)
Volume Advanced Materials Forum III
Edited by Paula Maria Vilarinho
Pages 175-178
DOI 10.4028/www.scientific.net/MSF.514-516.175
Citation Gunnar Suchaneck et al., 2006, Materials Science Forum, 514-516, 175
Online since May, 2006
Authors Gunnar Suchaneck, Alexander Deyneka, Lubomir Jastrabík, Gerald Gerlach
Keywords Dielectric Spectroscopy, Lead Zirconate Titanate, Self-Polarization
Abstract

Self-polarized Pb(Ti,Zr)O3 thin films deposited under lead enriched conditions by multitarget reactive sputtering at low substrate temperatures are characterized by tetravalent B-site occupation of excess lead. The imaginary part of the dielectric constant of such films shows a relaxor-like behavior. Evidence of a Pb2+/Pb4+ mixed valence is given by the temperature and frequency dependence of the ac conductivity. PbO volatility starts to deplete the growing film at a critical temperature of 500°C and Pb4+ formation disappears.

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