Paper Title:
TEM and XRD Investigation of MnO2 Microstructure and its Influence on ESR of Ta Capacitors
  Abstract

The development of solid electrolytic tantalum capacitors with MnO2 as counter electrode has been carried out in order to decrease the equivalent series resistance (ESR). Capacitor samples produced under different pyrolysis conditions have been characterized in terms of equivalent circuit parameters. The Ta/Ta2O5/MnO2 system has also been characterized by X-ray diffraction (XRD) and transmission electron microscopy (TEM). X-ray powder diffraction patterns obtained were inconclusive due to the MnO2 complex structure and to the presence of highly intense tantalum peaks that shadow interesting MnO2 diffraction peaks. Electron diffraction TEM results enabled the characterization of the microstructure and furthermore revealed the complex crystalline structure that affects the electrical properties of the semiconductor layer. A relation between the calculated circuit parameters and microstructure of MnO2 is discussed.

  Info
Periodical
Materials Science Forum (Volumes 514-516)
Edited by
Paula Maria Vilarinho
Pages
269-273
DOI
10.4028/www.scientific.net/MSF.514-516.269
Citation
D. Dias, R. Monteiro, P. A. Carvalho, A. C. Ferro, W. Lohwasser, "TEM and XRD Investigation of MnO2 Microstructure and its Influence on ESR of Ta Capacitors", Materials Science Forum, Vols. 514-516, pp. 269-273, 2006
Online since
May 2006
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$32.00
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