Paper Title:
Organic Materials for Active Layers in Transistors: Study of the Electrical Stability Properties
  Abstract

Field effect transistors based on several conjugated organic materials were fabricated and assesed in terms of electrical stability. The device characteristics were studied using steady state measurements as well as techniques for addressing trap states. Temperature-dependent measurements show clear evidence for an electrical instability occurring above 200 K that is caused by an electronic trapping process. It is suggested that the trapping sites are created by a change in the organic conjugated chain, a process similar to a phase transition.

  Info
Periodical
Materials Science Forum (Volumes 514-516)
Edited by
Paula Maria Vilarinho
Pages
33-37
DOI
10.4028/www.scientific.net/MSF.514-516.33
Citation
H. L. Gomes, P. Stallinga, D.M. de Leeuw, "Organic Materials for Active Layers in Transistors: Study of the Electrical Stability Properties", Materials Science Forum, Vols. 514-516, pp. 33-37, 2006
Online since
May 2006
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Price
$32.00
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