Effects of Layer Thickness and Incident Angle Variations
on DBR Reflectivity
|
| Journal |
Materials Science Forum (Volume 517) |
| Volume |
Functional Materials and Devices |
| Edited by |
A.K. Arof and S.A. Hashim Ali |
| Pages |
29-32 |
| DOI |
10.4028/www.scientific.net/MSF.517.29 |
| Online since |
June, 2006 |
| Authors |
N.M. Ahmed,
M.R. Hashim,
Z. Hassan
|
| Keywords |
Bragg Reflectors, DBR, VCSEL |
| Abstract |
In this paper we discussed the relation between depth errors that happened in films
growth and incidence angle variation on DBR reflectivity. We assume that there is 10% depth error
in high and low index materials, and there are four plus one situations to be considered. Four are
combinations of Hi +/- 10% error and Lo +/- 10% error, and no error. Our simulation results show
that the depth error makes the reflective band shift and it almost doesn’t reduce reflectivity. The
thickness error of +/- 10% in (Al0.4Ga0.6N/GaN) DBR structure (15 pairs) at 420nm was 42nm. A
theoretical analysis using Transfer Matrix Mode with MATLAB software on the influence of layer
thickness and incidence angle variation in vertical-cavity surface-emitting lasers with distributed
Bragg reflectors (DBRs) on lasing wavelength is presented. It is shown that changing the thickness
of the layers in the DBR mirror by only 10% is sufficient to produce shifts in the peak reflectance
wavelength up to ± 20 nm (for a blue laser at 420nm). This could limit the precision of a desired
wavelength, which is its reproducibility. |
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