Effects of Layer Thickness and Incident Angle Variations on DBR Reflectivity |
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| Journal | Materials Science Forum (Volume 517) |
|---|---|
| Volume | Functional Materials and Devices |
| Edited by | A.K. Arof and S.A. Hashim Ali |
| Pages | 29-32 |
| DOI | 10.4028/www.scientific.net/MSF.517.29 |
| Citation | N.M. Ahmed et al., 2006, Materials Science Forum, 517, 29 |
| Online since | June, 2006 |
| Authors | N.M. Ahmed, MD. Roslan Hashim, Zainuriah Hassan |
| Keywords | Bragg Reflector, DBR, VCSEL |
| Abstract | In this paper we discussed the relation between depth errors that happened in films growth and incidence angle variation on DBR reflectivity. We assume that there is 10% depth error in high and low index materials, and there are four plus one situations to be considered. Four are combinations of Hi +/- 10% error and Lo +/- 10% error, and no error. Our simulation results show that the depth error makes the reflective band shift and it almost doesn’t reduce reflectivity. The thickness error of +/- 10% in (Al0.4Ga0.6N/GaN) DBR structure (15 pairs) at 420nm was 42nm. A theoretical analysis using Transfer Matrix Mode with MATLAB software on the influence of layer thickness and incidence angle variation in vertical-cavity surface-emitting lasers with distributed Bragg reflectors (DBRs) on lasing wavelength is presented. It is shown that changing the thickness of the layers in the DBR mirror by only 10% is sufficient to produce shifts in the peak reflectance wavelength up to ± 20 nm (for a blue laser at 420nm). This could limit the precision of a desired wavelength, which is its reproducibility. |
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