Paper Title:
Development of Oxide Film in Aluminium Melt
  Abstract

Pure aluminum ingot (99.8 wt%) was melted to prepared chilled samples in this study. These samples were then removed to polish their surfaces and put in an ultrasonic cleaner filled with tap water. The polished surface would gradually show foggy marks after being subjected to a period of treating time. Oxide films, if entrapped, would crack, erode and detach from the chilled sample forming foggy marks on the polished surface. The sample then removed to measure oxygen and aluminum concentrations varied along the transition layer between the oxide film and aluminum matrix. Part of chilled samples was melted in a muffle furnace and subjected to different holding time. As the holding time increased, the transition layer between the oxide film and the matrix was increased and composed of different constituents varying from the Al matrix to the oxide film (mainly γ-Al2O3). This transition layer also showed different hardness measured by a nano-hardness tester. The morphologies of cracked oxide film and the eroded oxide particles were affected by the holding time after melted, and small amounts of silicon in the pure aluminum.

  Info
Periodical
Materials Science Forum (Volumes 519-521)
Edited by
W.J. Poole, M.A. Wells and D.J. Lloyd
Pages
1311-1316
DOI
10.4028/www.scientific.net/MSF.519-521.1311
Citation
L. W. Huang, Y. J. Chen, T. S. Shih, L. R. Hwang, "Development of Oxide Film in Aluminium Melt", Materials Science Forum, Vols. 519-521, pp. 1311-1316, 2006
Online since
July 2006
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Price
$32.00
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