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High Temperature Passive Oxidation Mechanism of CVD SiC

Journal Materials Science Forum (Volumes 522 - 523)
Volume High-Temperature Oxidation and Corrosion 2005
Edited by Shigeji Taniguchi, Toshio Maruyama, Masayuki Yoshiba, Nobuo Otsuka and Yuuzou Kawahara
Pages 27-36
DOI 10.4028/www.scientific.net/MSF.522-523.27
Citation Takashi Goto, 2006, Materials Science Forum, 522-523, 27
Online since August, 2006
Authors Takashi Goto
Keywords Bubble Formation, Chemical Vapour Deposition (CVD), CO Outward Diffusion, Linear Parabolic, Parabolic Rate Constant, Passive Oxidation, Rate Limiting Process, Silicon Carbide (SiC)
Abstract

The passive oxidation mechanism of CVD SiC was discussed from experimental results with high-temperature thermogravimetry and thermodynamic analyses. The bubble formation temperature around 1900 K could be too low for an oxygen inward diffusion limited process but conform to a CO outward diffusion limited process. The parabolic rate constant (kp) had weak oxygen partial pressure (PO2) dependence, kp ∝ PO2 n where n = 0.09 to 0.12. These n values may be consistent with the CO outward diffusion limited process. The activation energy of kp obtained in the present study, 210 kJ/mol, could suggest a different mechanism from the well-approved oxygen molecule permeation limited process at lower temperatures below 1600 K. Amorphous phase was significantly contained in SiO2 scales formed in an N2-O2 atmosphere. No effect of the amorphous formation on kp was identified.

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