Residual Stresses VII, ECRS7
| Paper Title | Page |
|---|---|
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The Importance of Residual Stresses in Microelectronic Products and Materials Authors: Wolfgang H. Müller |
1 |
|
An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth Authors: A. Kumar, U. Welzel, M. Wohlschlögel, W. Baumann, Eric J. Mittemeijer |
13 |
|
Authors: M. Wohlschlögel, W. Baumann, U. Welzel, Eric J. Mittemeijer |
19 |
|
Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods Authors: Cristy Leonor Azanza Ricardo, Mirco D'Incau, Paolo Scardi |
25 |
|
Authors: Thorsten Manns, Jens Gibmeier, Berthold Scholtes |
31 |
|
Authors: Ingwer A. Denks, Manuela Klaus, Christoph Genzel |
37 |
|
Authors: H. Michaud, Jean Michel Sprauel, F. Galzy |
45 |
|
Stability of Residual Stresses of Deep Rolled Sintered Iron at Quasistatic and Cyclic Loading Authors: Jens Merkel, Volker Schulze, Alexander Wanner, Otmar Vöhringer |
51 |
|
Authors: I. Altenberger, Ivan Nikitin, P. Juijerm, Berthold Scholtes |
57 |
|
Residual Stresses Induced by Cross-Rolling Authors: Krzysztof Wierzbanowski, Sebastian Wroński, Andrzej Baczmański, Mirosław Wróbel, Chedly Braham, Michael E. Fitzpatrick, Alain Lodini |
63 |