An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth |
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| Journal | Materials Science Forum (Volumes 524 - 525) |
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| Volume | Residual Stresses VII, ECRS7 |
| Edited by | W. Reimers and S. Quander |
| Pages | 13-18 |
| DOI | 10.4028/www.scientific.net/MSF.524-525.13 |
| Citation | A. Kumar et al., 2006, Materials Science Forum, 524-525, 13 |
| Online since | September, 2006 |
| Authors | A. Kumar, U. Welzel, M. Wohlschlögel, W. Baumann, Eric J. Mittemeijer |
| Keywords | Information Depth, Penetration Depth, Stress Gradient |
| Abstract | A rigorous strategy for (X-ray) diffraction stress measurements at fixed penetration/information depths is described. Thereby errors caused by lack of penetration-depth control in traditional (X-ray) diffraction (sin2ψ) measurements are annulled. The ranges of accessible penetration/information depths and experimental aspects are briefly discussed. The power of the method is illustrated by the analysis of an only small stress gradient in a sputter-deposited nickel layer. |
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