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An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth

Journal Materials Science Forum (Volumes 524 - 525)
Volume Residual Stresses VII, ECRS7
Edited by W. Reimers and S. Quander
Pages 13-18
DOI 10.4028/www.scientific.net/MSF.524-525.13
Citation A. Kumar et al., 2006, Materials Science Forum, 524-525, 13
Online since September, 2006
Authors A. Kumar, U. Welzel, M. Wohlschlögel, W. Baumann, Eric J. Mittemeijer
Keywords Information Depth, Penetration Depth, Stress Gradient
Abstract

A rigorous strategy for (X-ray) diffraction stress measurements at fixed penetration/information depths is described. Thereby errors caused by lack of penetration-depth control in traditional (X-ray) diffraction (sin2ψ) measurements are annulled. The ranges of accessible penetration/information depths and experimental aspects are briefly discussed. The power of the method is illustrated by the analysis of an only small stress gradient in a sputter-deposited nickel layer.

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