Paper Title:
An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth
  Abstract

A rigorous strategy for (X-ray) diffraction stress measurements at fixed penetration/information depths is described. Thereby errors caused by lack of penetration-depth control in traditional (X-ray) diffraction (sin2ψ) measurements are annulled. The ranges of accessible penetration/information depths and experimental aspects are briefly discussed. The power of the method is illustrated by the analysis of an only small stress gradient in a sputter-deposited nickel layer.

  Info
Periodical
Materials Science Forum (Volumes 524-525)
Edited by
W. Reimers and S. Quander
Pages
13-18
DOI
10.4028/www.scientific.net/MSF.524-525.13
Citation
A. Kumar, U. Welzel, M. Wohlschlögel, W. Baumann, E. J. Mittemeijer, "An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth ", Materials Science Forum, Vols. 524-525, pp. 13-18, 2006
Online since
September 2006
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