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E7 - New Strain Scanner at HMI - High Q-Resolution for Phase-Sensitive Analysis of Stress Distributions

Journal Materials Science Forum (Volumes 524 - 525)
Volume Residual Stresses VII, ECRS7
Edited by W. Reimers and S. Quander
Pages 205-210
DOI 10.4028/www.scientific.net/MSF.524-525.205
Citation Florian Henkel et al., 2006, Materials Science Forum, 524-525, 205
Online since September, 2006
Authors Florian Henkel, Ulrike Hermeking-Goebel, Peter Lemke, Thomas Wilpert, Christian Pietsch, Rainer Schneider
Keywords Absolute Measurements, Background Lighting, Calibration, High Resolution Camera System, Instrument Alignement, Motor Controlled Slit System, Residual Stress
Abstract

A large distance between the reactor core and the monochromator together with a take-off angle of 90° leads to low flux but high angular resolution of the diffractometer around 90° scattering angle. The sample-table consists of two goniometers for heavy loads. An x-y-z table for heavy loads can be mounted, as well as different eulerian cradles, a mirror furnace or a tensile rig. The detector is a 20x20cm2 position sensitive delay-line detector made by EMBL. A sophisticated primary and secondary slit system together with the recently installed high-resolution camera system allows the application of the high precision instrument alignment and calibration system recently developed at HMI. Here some special features of the instrument are presented and the consequences are outlined.

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