Paper Title:
Review of Residual Stress Determination and Exploitation Techniques Using X-Ray Diffraction Method
  Abstract

Although x-ray diffraction techniques have been applied to the measurement of residual stress in the industry for decades, some of the related details are still unclear to many production and mechanical testing engineers working in the field. This is because these details, specifically those associated with the transition between diffraction and mechanics, are not always emphasized in the literature. This paper will emphasize the appropriate calculation methods and the steps necessary to perform high quality residual stress measurements. Additionally, details are given regarding the difference between mechanical and x-ray elastic constants, as well as the true meaning of stress and strain from both diffraction and strain gage point of view. Cases where the material is subject to loading above the yield limit are also included.

  Info
Periodical
Materials Science Forum (Volumes 524-525)
Edited by
W. Reimers and S. Quander
Pages
229-234
DOI
10.4028/www.scientific.net/MSF.524-525.229
Citation
M. Belassel, J. Pineault, M.E. Brauss, "Review of Residual Stress Determination and Exploitation Techniques Using X-Ray Diffraction Method ", Materials Science Forum, Vols. 524-525, pp. 229-234, 2006
Online since
September 2006
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Price
$32.00
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