Paper Title:
Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods
  Abstract

A new algorithm is proposed to determine the through-thickness residual stress gradient by X-ray Diffraction measurements on progressively thinned components. The procedure is based on a chemical or electrochemical attack of the component surface, which is then measured at each thinning stage. The simple algorithm provided for by a specific norm has been revised to take into account the X-ray absorption effects and the conditions of mechanical equilibrium of the component. The new procedure is illustrated for a typical case of study concerning a shot-peened metal component.

  Info
Periodical
Materials Science Forum (Volumes 524-525)
Edited by
W. Reimers and S. Quander
Pages
25-30
DOI
10.4028/www.scientific.net/MSF.524-525.25
Citation
C. L. Azanza Ricardo, M. D'Incau, P. Scardi, "Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods ", Materials Science Forum, Vols. 524-525, pp. 25-30, 2006
Online since
September 2006
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Price
$32.00
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