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Determination of Residual Stress Fields with High Local Resolution

Journal Materials Science Forum (Volumes 524 - 525)
Volume Residual Stresses VII, ECRS7
Edited by W. Reimers and S. Quander
Pages 279-284
DOI 10.4028/www.scientific.net/MSF.524-525.279
Citation Bernd Hasse et al., 2006, Materials Science Forum, 524-525, 279
Online since September, 2006
Authors Bernd Hasse, Mustafa Koçak, Walter Reimers
Keywords Sin2-Ψ Method, Stress Determination, Synchrotron Radiation (XRD), X-Ray Imaging
Abstract

The non-destructive and phase selective determination of residual stresses caused by material processing (such as welding) in polycrystalline samples is usually performed by diffraction methods. In order to obtain information about stress fields at high spatial resolution with conventional methods, for example with micro beam techniques, the sample needs to be scanned in a very time consuming manner. A much faster method is the simultaneous investigation of a larger area using position sensitive diffractometry. This method was used for the analysis of the residual stress distribution in laser beam welded thin (2 mm and 3 mm) magnesium sheets.

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