Paper Title:
Residual Stress Analysis Around Foreign Object Damage Using Synchrotron Diffraction
  Abstract

The current study compares the residual strain around foreign object damage (FOD), measured using synchrotron diffraction, to the strain predicted by a plastic model with power-law dependence. It is shown that the measured strains are significantly lower than those predicted by the model. This may be explained in part, by the inability of the model to account for damage mechanisms such as micro-cracking and shear band formation.

  Info
Periodical
Materials Science Forum (Volumes 524-525)
Edited by
W. Reimers and S. Quander
Pages
291-296
DOI
10.4028/www.scientific.net/MSF.524-525.291
Citation
P. Frankel, J. Ding, M. Preuss, J. Byrne, P. J. Withers, "Residual Stress Analysis Around Foreign Object Damage Using Synchrotron Diffraction ", Materials Science Forum, Vols. 524-525, pp. 291-296, 2006
Online since
September 2006
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Price
$32.00
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