Paper Title:
Residual Stress Evolution during Decomposition of Ti(1-x)Al(x)N Coatings Using High-Energy X-Rays
  Abstract

Residual stresses and microstructural changes during phase separation in Ti33Al67N coatings were examined using microfocused high energy x-rays from a synchrotron source. The transmission geometry allowed simultaneous acquisition of x-ray diffraction data over 360° and revealed that the decomposition at elevated temperatures occurred anisotropically, initiating preferentially along the film plane. The as-deposited compressive residual stress in the film plane first relaxed with annealing, before dramatically increasing concurrently with the initial stage of phase separation where metastable, nm-scale c-AlN platelets precipitated along the film direction. These findings were further supported from SAXS analyses.

  Info
Periodical
Materials Science Forum (Volumes 524-525)
Edited by
W. Reimers and S. Quander
Pages
619-624
DOI
10.4028/www.scientific.net/MSF.524-525.619
Citation
M. R. Terner, P. Hedström, J. Almer, J. Ilavsky, M. Odén, "Residual Stress Evolution during Decomposition of Ti(1-x)Al(x)N Coatings Using High-Energy X-Rays", Materials Science Forum, Vols. 524-525, pp. 619-624, 2006
Online since
September 2006
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