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Residual Stresses VII, ECRS7

Materials Science Forum Volumes 524 - 525

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• p199 Design of Engineering Diffractometer at J-PARC   [ 253 K ]
  Authors: Stefanus Harjo, Atsushi Moriai, Shuki Torii, Hiroshi Suzuki, Kentaro Suzuya, Yukio Morii, Masatoshi Arai, Yo Tomota, Koichi Akita, Yoshiaki Akiniwa
• p205 E7 - New Strain Scanner at HMI - High Q-Resolution for Phase-Sensitive Analysis of Stress Distributions   [ 141 K ]
  Authors: Florian Henkel, Ulrike Hermeking-Goebel, Peter Lemke, Thomas Wilpert, Christian Pietsch, Rainer Schneider
• p211 The New Materials Science Diffractometer STRESS-SPEC at FRM-II   [ 1 M ]
  Authors: Michael Hofmann, Günther A. Seidl, Joana Rebelo-Kornmeier, Ulf Garbe, Rainer Schneider, Robert C. Wimpory, Uwe Wasmuth, Ulf Noster
• p217 SALSA: Advances in Residual Stress Measurement at ILL   [ 2 M ]
  Authors: Thilo Pirling, Giovanni Bruno, Philip J. Withers
• p223 The New and Upgraded Neutron Instruments for Materials Science at HMI - Current Activities in Cooperation with Industry   [ 169 K ]
  Authors: T. Poeste, Robert C. Wimpory, Rainer Schneider
• p229 Review of Residual Stress Determination and Exploitation Techniques Using X-Ray Diffraction Method   [ 164 K ]
  Authors: M. Belassel, J. Pineault, M.E. Brauss
• p235 New Type of Diffraction Elastic Constants for Stress Determination   [ 254 K ]
  Authors: Andrzej Baczmański, Albert Tidu, Paul Lipinski, Michel Humbert, Krzysztof Wierzbanowski
• p241 Residual Stress Reconstruction by Variational Eigenstrain Procedures   [ 208 K ]
  Authors: Alexander M. Korsunsky, Gabriel M. Regino, David Nowell
• p247 Application of the cos α Method to Area Detector Type Neutron Stress Measurement   [ 320 K ]
  Authors: Toshihiko Sasaki
• p253 Residual Stress Distribution in Pure Bending Beam Subjected to Tensile Failure on One Side   [ 163 K ]
  Authors: X.B. Wang
• p259 Evaluation of Uncertainties of Measurement for Residual Stresses in Coatings Determined by the Dilatometric Method   [ 205 K ]
  Authors: Alexander Ryabchikov, Harri Lille, R. Laaneots
• p267 Aspects of Residual Stress Determination Using Energy-Dispersive Synchrotron X-Ray Diffraction   [ 391 K ]
  Authors: Axel Steuwer, Matthew Peel, Thomas Buslaps
• p273 Micro Diffraction Imaging of Bulk Polycrystalline Materials   [ 360 K ]
  Authors: Thomas Wroblewski, A. Bjeoumikhov, Bernd Hasse
• p279 Determination of Residual Stress Fields with High Local Resolution   [ 562 K ]
  Authors: Bernd Hasse, Mustafa Koçak, Walter Reimers
• p285 Evaluation by Synchrotron Radiation of Shape Factor Effects on Residual Stress in Nitrided Layers   [ 724 K ]
  Authors: Vincent Goret, Agnès Fabre, Laurent Barrallier, Patrick Vardon