SiC power MOSFETs are expected to be normally-off type fast switching devices. The on-resistance of SiC power MOSFETs is much higher than the value predicted from the physical properties of SiC. This is caused by the low channel mobility due to high interface state density (Dit). We have already reported that 4H-SiC MOSFETs on the C(0001 _ ) face had higher inversion-channel mobility. However, there is the SiO2/SiC interface roughness problem in SiC MOSFETs. There are many steps at the SiO2/SiC interface because a high off-angle is necessary for SiC epitaxial growth. These steps might make SiO2/SiC interfaces rough, which leads to reduction of channel mobility. In this work, we have investigated the effect of the SiO2/SiC interface roughness caused by the off-angle on the inversion channel mobility of 4H-SiC MOSFETs fabricated on the C(0001 _ ) face. The inversion-channel mobility of MOSFETs fabricated on the 4H-SiC C(0001 _ ) face substrate with the vicinal off-angle(0.8°) is higher than that of MOSFETs fabricated on the 4H-SiC C(0001 _ ) face substrate with the 8° off-angle. Reduction of the off-angle is very useful for improvement of channel mobility. A C(0001 _ ) epitaxial substrate with the vicinal off-angle would be suitable for SiC DMOSFETs.