Paper Title:
The Role of Residual Source/Drain Implant Damage Traps on SiC MESFET Drain I-V Characteristics
  Abstract

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Periodical
Materials Science Forum (Volumes 527-529)
Edited by
Robert P. Devaty, David J. Larkin and Stephen E. Saddow
Pages
1247-1250
DOI
10.4028/www.scientific.net/MSF.527-529.1247
Citation
J. Adjaye, M. S. Mazzola, A.V. Los, "The Role of Residual Source/Drain Implant Damage Traps on SiC MESFET Drain I-V Characteristics", Materials Science Forum, Vols. 527-529, pp. 1247-1250, 2006
Online since
October 2006
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