Paper Title:

Growth of AlN and AlN-SiC Solid Solution by Sublimation Method

Periodical Materials Science Forum (Volumes 527 - 529)
Main Theme Silicon Carbide and Related Materials 2005
Edited by Robert P. Devaty, David J. Larkin and Stephen E. Saddow
Pages 1501-1504
DOI 10.4028/www.scientific.net/MSF.527-529.1501
Citation Mikhail Anikin et al., 2006, Materials Science Forum, 527-529, 1501
Online since October, 2006
Authors Mikhail Anikin, Didier Chaussende, Etienne Pernot, O. Chaix-Pluchery, H. Roussel, Michel Pons, Roland Madar
Keywords Aluminum Nitride (AlN), Bulk Growth, Crack, Sublimation
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Abstract

AlN is considered as the most suitable substrate material for further development of high quality and high performance nitride-based micro- and opto-electronics. AlN ingots are often grown on SiC seeds. To solve the formation of cracks due to the difference in lattice parameters between seed and crystal we chose to “adapt” the lattice mismatch by a buffer layer of the (AlN)x(SiC)1-x solid solution. This paper gives some inputs on the growth of AlN and the solid solution by the sublimation technique, in terms of materials compatibility, hetero- and homo-epitaxial growth of AlN and on the preparation of crack-free solid solution single crystals.